I am pleased to announce the opening of the ToF-SIMS Lab at Rice University, Houston, Texas.
The Rice ToF-SIMS lab features the IONTOF TOF.SIMS5 combined with an in-situ Surface Probe Microscope (SPM, VLS-80 from NanoScan). The ToF-SIMS lab at Rice University offers an experimental facility for sample analysis via ToF-SIMS and/or AFM, including user training and support for sample preparation and analysis. The lab is available to academic and industrial researchers through the Shared Equipment Authority (www.sea.rice.edu).
We can work with academic and industrial partners through collaborative projects, conduct fee-for-service analysis, and train and host users for on-site access to the ToF-SIMS lab.
We will conduct collaborative and independent research studies. Our current interests include the understanding of ion-matter interactions, the development of analysis protocols for ToF-SIMS characterization, three-dimensional reconstruction of organic, inorganic, and hybrid materials, and the use of analytical tools including Multivariate analysis, advanced computing algorithms (decision trees, machine learning…), and Monte Carlo simulations of ion sputtering.
We seek to be an active group in the SIMS community and look forwarding to organizing SIMS meetings and workshops in the future, and we are interested in developing a collaborative network.
Please feel you free to contact us by email and learn more about us through our website: http://simslab.rice.edu.
