The SIMS lab focuses on the understanding of the ion-matter interactions, and the development of analysis protocols for the ToF-SIMS characterization which can potentially address a wide range of materials and structures. A strong interest is given to the use of various analytical tools such as Multivariate analysis, advanced computing algorithms (decision trees, machine learning…), and statistical simulation, in particular, Monte-Carlo simulation for the ion sputtering. Scanning Probe Microscopy, particularly, for data fusion in correlative microscopy, is explored to offer new potential applications and another interpretation of the chemical information.
This work is supported by the National Science Foundation Major Research Instrumentation program (CBET-1626418). The ToF-SIMS facility is an external user facility open to all researchers, including non-profit, government, and industrial researchers.
The links below provide more information on specific techniques and areas of research:
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Characterization of Batteries using ToF-SIMS analysis
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- H. Ardebili (Principal Investigator, University of Houston), R. Verduzco (Co-Investigator, Rice University) and William Q. Walker (Partner, Johnson Space Center NASA), “Flexible Low-Temperature Lithium Ion Batteries for Subsea Applications”, Subsea Systems Institute, (2019).
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