SCIENTIFIC PROGRAM
Please download the detailed program, here. (version: 09/08/2023)
Book of abstract, here (version: 09/08/2023)
Invited speakers
Invited speaker #1, Dr. Jean-Paul Barnes, Scientific Director of Semiconductor Technology platforms and Head of the Ion Beam analysis group, CEA-LETI, France.
Title: “Correlative analysis of beam and air-sensitive materials using TOF-SIMS, SEM and XPS“
Abstract: Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) is an essential analysis technique for materials and device development for semiconductor technology. However, to overcome limitations in lateral resolution or quantification issues the use of correlative analysis approaches may be necessary. Fortunately, semiconductor research facilities are able to produce well-controlled, bespoke samples that allow the development of such correlative approaches and the improvement in performance to be assessed. For example scanning probe measurements can be correlated with TOF-SIMS depth profiling data on the same sample to correct for sputter rate differences [1] or to measure mechanical or electrical properties. In a similar fashion, morphological and compositional data from the same sample volume can be obtained by performing X-ray tomography on a post-shaped sample prior to FIB-TOF-SIMS analysis [2]. The availability of cluster ion sources has meant that TOF-SIMS analysis can now be extended to organic and biological materials and meet the challenges of applications such as organic light emitting diodes (OLED) [3], implantable electrodes for decoding brain signals [4] or biomass production in a symbiotic context. In this specific case, the correlation of TOF-SIMS with SEM and AFM measurements and appropriate data treatment can help decipher metabolic interactions between symbiotic partners. For OLED and implantable electrode applications, TOF-SIMS can be correlated with photoemission techniques such as X-ray photoelectron spectroscopy (XPS) or X-ray photoemission electron microscopy (XPEEM) to understand the degradation mechanisms occurring. To ensure that the sample analysis conditions (air exposure, surface contamination, beam damage, ..) do not create sample modifications that could be confused with degradation from sample ageing a wedge crater protocol has been developed. This consists in milling a wedge crater in a sample with a very shallow angle using argon cluster sputtering. This allows exactly the same area of the sample to be analyzed by several technique whilst minimizing beam damage to deeply buried layers. The sample is transferred between instruments under vacuum or inert gas environment. Tandem mass spectrometry (tandem-MS) has been used to help confirm peak assignments in these complex organic samples. In an attempt to increase the signal available for tandem-MS, the effect of MALDI matrices on the secondary ion yield of characteristic secondary ions has been evaluated on simplified OLED samples.
Part of this work, carried out on the Platform for Nanocharacterisation (PFNC), was supported by the “Recherches Technologiques de Base” and the “CARNOT” program of the French National Research Agency (ANR).
[1] M. A. Moreno et al. Journal of Vacuum Science and Technology B, vol. 36, MAY 2018.
[2] A. Priebe et al. Ultramicroscopy, vol. 173, FEB 2017.
[3] Sandrez et al. Advanced Electronic Materials, vol. 7, 2021.
[4] A. G. De Carvalho et al. Biointerphases, vol. 15, 2020..
Biography: Jean-Paul Barnes received the MEng degree in Metallurgy and the Science of Materials from Oxford University and the DPhil in Materials Science from Oxford University. Since 2004 he was worked on the development of difference nanocharacterization techniques at the CEA-LETI in Grenoble. First on electron energy loss spectroscopy in the (S)TEM and then on SIMS, ToF-SIMS and atom probe. Since 2009 he has led the ion beam analysis group at the CEA-Leti. He has co-authored one book chapter and more than 190 publications in international scientific journals and conference proceedings. He teaches both at the local university and for the internal program of the CEA. Since 2020, he is also scientific director for the semiconductor technology platforms at the CEA-Leti.
Invited speaker #2, Dr. Anton Ievlev, R&D staff-scientist in the Center for Nanophase Materials Sciences at Oak Ridge National Laboratory, United States.
Title: “Correlated functional and chemical studies in energy materials using combined AFM/ToF-SIMS platform“
Abstract: The performance of energy storage and conversion devices, including batteries, fuel cells, and photovoltaics, is defined by the delicate interplay of electrical response and charge carrier migration at the nanoscale. Although physical behavior and macroscopic functional response of these materials is well established, intrinsic chemical phenomena associated with ionic motion or localized electrochemical reactions can dramatically alter their behavior and thus restrict area of utilization. Over the last decade, advancements in development of novel characterization tools such as atomic force microscopy (AFM) have revolutionized our understanding of the electrical and mechanical response of materials; however, dynamic electrochemical behavior and ion migration remain poorly understood. Recently time-of-flight secondary ion mass spectrometry (ToF-SIMS) has proven to be effective tool for characterization of static chemical states in energy materials. However, its application to study of dynamic electrochemical processes still requires development.
Here we introduce approach based on combined AFM/ToF-SIMS platform for correlated studies of the dynamic chemical phenomena on the nanoscale in operando conditions. Being used for characterization of the perovskite materials it allowed direct observation of the ionic migration within the device in externally applied electric fields, which is important for fundamental understanding of the material functionality. Similarly, this approach allowed to study relaxation processes of the chemical phenomena in ferroelectric materials as a function of sample temperature. Altogether, developed approach enables direct characterization of interplay between chemical and functional response in energy materials and aids in the development and optimization of novel devices.
This research was conducted at the Center for Nanophase Materials Sciences, which is a DOE Office of Science User Facility and using instrumentation within ORNL’s Materials Characterization Core provided by UT-Battelle, LLC under Contract No. DE-AC05-00OR22725 with the U.S. Department of Energy.
Biography: Anton V. Ievlev received his PhD in Physics at Ural Federal University in Russia in 2012. His research interests are focused on correlated functional and chemical studies of the functional materials using multimodal approaches combining atomic force microscopy, mass spectrometry and optical spectroscopy.
Invited speaker #3, Dr. Christine Jilly-Rehak, Research Scientist/Lab Manager at Stanford University, United States.
Title: “Using the NanoSIMS for high-precision stable isotope analysis of terrestrial and extra-terrestrial materials“
Abstract: Nano-scale secondary ion mass spectrometry (NanoSIMS) analyses are widely used for high-spatial resolution but low analytical precision isotopic imaging in a variety of materials. Routine imaging analyses are mainly qualitative, though high-sensitivity trace elements can often be quantified at the >10% level and stable isotopes at the ~ tens to hundreds of ‰ level with matrix-matched standards. Historically, high-precision stable isotope analyses have instead utilized other methods such as large-geometry SIMS, MC-ICPMS, or TIMS. However, with further technique development researchers have now been pushing NanoSIMS stable isotope precision down to below ~5‰, into a range that is useful for understanding geologic and biologic processes that occur on earth and on other Solar System bodies (e.g., [1], [2]).
We present recent work from the Stanford NanoSIMS Lab that highlights high-precision stable isotope analyses for S- and O-. Coordinated sulfur isotope imaging, high-precision spot/depth profile analyses, and trace element analyses were taken in terrestrial pyrite minerals from various ore-mining locations as well as from sulfide standards [3]. Spot analyses were conducted with a 2×2 to 5×5 micron rastered Cs+ primary beam operating at 350pA current, while ion images were obtained in 20×20 to 30×30 micron raster with a 5pA Cs+ beam focused to ~100nm. The d34S reproducibility on standards was on average ~0.86‰ (1sd), providing sufficient resolution to observe isotopic fractionations in sulfides that can vary by up to ~tens of permil [3]. Fig. 1 demonstrates how NanoSIMS can produce high-resolution trace element mapping for Au, coupled with spot analyses that also provide depth information during sputtering. The pyrite grains analyzed contain mineral zoning in Au and other trace elements that correlate with variations in d34S. The S-enrichments can be used to infer formation histories of these hydrothermally altered minerals.
Similar methods are in development for O- isotopes (both d18O and d17O) in magnetite standards at <5‰ reproducibility (Jilly-Rehak in prep.), for analysis of aqueously-formed magnetite in meteorites and other Solar System materials. Future work aims to extend this O-isotopic analysis to other minerals, including silicates, carbonates, and other oxides.
Figure 1. A) Reflected light image of pyrite mineral from Turquoise Ridge. B) NanoSIMS 197Au- map in pyrite. C and D) Depth profiles showing correlations between 197Au- and d34S composition. Data from [3] and in prep.
References
[1] J. Simon et al., (2019). Ap. J. L. 884, L29. [2] J. Zhang et al., (2014). J. Anal. Atom. Spec. 29, 1934-1943. [3] Holley et al., (2022). Geology 50, 660-664.
Biography: Christie is a research scientist specializing in secondary ion mass spectroscopy (SIMS). She serves as a lab manager for the Cameca NanoSIMS 50L instrument in the Stanford Nano Shared Facilities, as well as the SHRIMP-RG secondary ion mass spectrometer in the Geological Sciences department. Prior to Stanford, Christie received her Ph.D. in Geology and Geophysics from the University of Hawaii at Manoa, utilizing their Cameca 1280 IMS ion microprobe for isotopic analyses of meteoritic materials, as well as SEM/EDS and EPMA for sample characterization. She completed a postdoc at UC Berkeley Space Sciences Laboratory, where she gained experience in numerous other microanalytical techniques, including FIB, TEM, and synchrotron XANES. Her primary research interests include stable isotope geochemistry and radiometric dating of terrestrial and extraterrestrial materials.
Chris Anderton
Credit: Andrea Starr | Pacific Northwest National Laboratory
Invited speaker #4, Dr. Christopher Anderton, Chemist at Pacific Northwest National Laboratory, United States.
Title: “Utilizing Correlative Imaging Approaches with ToF-SIMS Expands Our Biochemical Interpretation Abilities Across Biological Kingdoms“
Abstract: The Environmental Molecular Sciences Laboratory (EMSL) is a U.S. Department of Energy National zUser Facility, located on the campus of Pacific Northwest National Laboratory, which houses a range of capabilities dedicated to addressing some of the most critical challenges facing our nation and the world. Within its suite of capabilities, EMSL houses a number of imaging tools, including time-of-flight secondary ion mass spectrometry (ToF-SIMS; IONTOF V) and other mass spectrometry imaging (MSI) systems. We are utilizing ToF-SIMS to understand processes that govern fungal mycelial bridging of nutrient sources within synthetic soil habitats (SSHs). Here, we inoculated Fusarium chlamydosporum into SSHs that concurrently simulate the porosity and mineralogy of soil, where ToF-SIMS demonstrated cation enrichment and micronutrient translocation from minerals by fungal hyphae. These results were correlated with data acquired using X-ray near edge absorption analysis of fungal growth in mineral-doped SSHs, which showed mineral speciation as result of hyphal uptake of micronutrients from minerals. Furthermore, ToF-SIMS and SEM/EDX enabled us to observe how fungi biosense specific mineral types within the SSHs. In other work done in collaboration with the University of Washington, we utilized the unique ion bunching, tandem MS capable, gas cluster primary ion beam ToF-based SIMS instrument (J105-3D Chemical Imager; Ionoptika Ltd.), in combination with bulk lipidomics (e.g., liquid chromatography tandem mass spectrometry), to show that we could simultaneously localize lipids, with high confidence in their identifications, within flatworms (Phagocata gracilis). A follow up study confirmed their localization and identifications using the ultrahigh mass resolution matrix-assisted laser desorption/ionization (MALDI)-MSI system housed in EMSL. Currently, we are using a similar approach to reveal changes in the spatial lipidome and metallome within ovarian tumor-models following exposure to treatment. Notably, using this multimodal methodology permits us the ability to explore how ferroptosis inducers can be used in cancer therapies. These results and more demonstrate the value of ToF-SIMS in increasing our ability to interpret complex biological processes, particularly when used in coordination with other imaging modalities. .
Biography: Dr. Chris Anderton is the team leader for the Biogeochemical Transformations team in PNNL’s Environmental Molecular Sciences Division and the Environmental Molecular Sciences Laboratory (EMSL) user program. He has an extensive background in elucidating chemical interactions occurring across all kingdoms of life, including those within soils and the rhizosphere.
Through his graduate endeavors to his recent position, he focuses on the power of multimodal imaging methods to expand the type of information gained from samples. For his graduate work and postdoc at National Institute of Standards and Technology, he used atomic force microscopy, scanning electron microscopy, and secondary ion mass spectrometry to understand the physicochemical properties of biological samples.
At PNNL, his focus has been, in part, on expanding the mass spectrometry imaging capability within EMSL—making these valuable tools for analyzing bacteria communities, rhizosphere-related systems, and even human health-related processes. He also focuses on visualizing the key mechanisms that drive interkingdom interactions within soil to understand the key drivers that lead to resiliency in the face of a changing environment.
Program Schedule
Monday, September 11, 2023
8:30 am- 12:00 pm U.S Central Time: Tutorial seminar series
Tutorial seminar: XPS software seminar from ThermoFischer (Space Science & Technology building 300)
This event will include a 15 min- coffee break.
1:30 pm-5:00 pm U.S Central Time: Tutorial seminar series
Tutorial seminar: Workshop & demonstration on AFM from Park Systems (Space Science & Technology building 300)
This event will include a 15 min- coffee break.
These events are only reserved to the registered participants who have selected to participate in the add-on option and the number of attendees will be limited
Tuesday, September 12, 2023
7:30 am – 4:30 pm U.S Central Time: Registration
8:15 am – 8:35 pm: Welcome & Opening from Prof. J. McNew & Dr. T. Gilheart
Surface Analysis Tutorials day (BRC Auditorium)
8:40 am – 9:20 am: [GUEST SPEAKER] Ravi Chintala , Bruker, “Surface metrology using White Light Interferometry and Atomic Force Microscopy”
9:20 am – 10:00 am: [GUEST SPEAKER] Ashley Maloney, Physical Electronics, “Auger Electron Spectroscopy- Fundamentals and Applications”
30 min- coffee break.
10:30 am – 11:10 am: [GUEST SPEAKER] James Lallo, Thermo Fisher Scientific, “Introduction to X-ray Photoelectron Spectroscopy for Surface Analysis”
11:10 am – 11:50 am: [GUEST SPEAKER] Kelvin Xie, Texas A&M University, “Explore the 4th Dimensional Information in Transmission Electron Microscopy”
Lunch Break (Exhibition Hall)
12:00 am – 1:30 pm: Luncheon Talk from the Sponsors
Surface Analysis Tutorials (BRC Auditorium)
1:30 pm – 2:10 pm: [GUEST SPEAKER] Dean Miler, Tescan, “The FIB-SEM as a nanoscale laboratory”
2:10 pm – 2:50 pm: [GUEST SPEAKER] Semih Gulec, Anton Paar, “Small Angle X-ray Scattering and X-ray Analysis”
30 min- coffee break.
3:10 pm – 3:50 pm: [GUEST SPEAKER] Marinus Hopstaken, IBM, “SIMS Depth Profiling in Thin film Materials for Advanced Microelectronics and Photovoltaic Devices” – virtual
3:50 pm – 4:20 pm: [GUEST SPEAKER] Marcus Rohnke, Justus Liebig University Giessen, “Mass Spectrometric 3D Imaging in Materials and Life Sciences by ToF-SIMS”
Surface Analysis Tutorials: Poster session (Event Hall)
4:30 pm – 5:30 pm: Poster presentation
Wednesday, September 13, 2023
7:30 am – 4:30 pm U.S Central Time: Registration
8:15 am – 8:30 pm: Welcome & Opening from Prof. M. Eller & Dr. T. Terlier
SESSION: Novel Techniques & Instrumentation, Multi-technique approach to characterization (BRC Auditorium)
8:30 am – 9:10 am: [INVITED SPEAKER] Jean-Paul Barnes, CEA-Leti, “Correlative analysis of beam and air-sensitive materials using TOF-SIMS, SEM and XPS”
9:10 am – 9:30 am: Julia Zackel, IONTOF GmbH, “Orbitrap™ MS/MS and TOF MS/MS: A comparison of two new approaches for peak identification in organic SIMS applications”
9:30 am – 9:50 am: Zihua Zhu, Pacific Northwest National Lab, “A novel PCA tool based on Python for analysis of complex ToF-SIMS spectra”
9:50 am – 10:10 am: Stanislav Verkhoturov, Texas A&M University, “SIMS via Large Cluster Impacts on 2D and 3D Analytes: Mechanisms of Ion Emission in Transmission and Reflection Directions”
30 min- coffee break.
10:40 am – 11:00 am: Arnaud Delcorte, Université Catholique de Louvain, “Soft biomolecule transfer using Ar clusters: solvent-free multilayer buildup and matrix-enhanced mass spectrometry” – virtual
11:00 am – 11:20 am: Mary Kraft, University of Illinois Urbana-Champaign, “Strategy for the Depth Correction of 3D SIMS Depth Profiling Images that Accounts for Differential Sputtering”
11:20 am – 11:40 am: Zbigniew Postawa, Jagiellonian University, “Molecular dynamics simulations of trehalose sputtering by water cluster projectiles”
11:40 am – 12:00 pm: Peter Williams, Arizona State University, ““Canode”: An improved duoplasmatron design for negative primary ion generation for secondary ion mass spectrometry ” – virtual
Lunch Break (Exhibition Hall)
12:00 am – 1:30 pm: Luncheon Talk from the Sponsors
SESSION: Biomaterials, Life Science & Biotechnology, Tissue Imaging (BRC Auditorium)
1:30 pm – 2:10 pm: [INVITED SPEAKER] Christopher Anderton, Pacific Northwest National Lab, “Utilizing Correlative Imaging Approaches with ToF-SIMS Expands Our Biochemical Interpretation Abilities Across Biological Kingdoms”
2:10 am – 2:30 pm: Xiaoyu Gao, McGill University, “The use of TOF-SIMS to investigate pathways for ZnO@SiO2 nanoparticle translocation in tomato plants following foliar application” – virtual
2:30 am – 2:50 pm: Hua Tian, University of Pittsburgh, “Spatial single-cell multiomics using giant cluster ion beam secondary ion mass spectrometry (GCIB-SIMS)”
2:50 am – 3:10 pm: John Cliff, Pacific Northwest National Lab, “Uncertainty budget for isotopic analyses of microbial populations using a novel sample preparation method
30 min- coffee break.
3:40 pm – 4:00 pm: Marcus Rohnke, Justus Liebig University Giessen, “High resolution Orbi-SIMS mediated metabolomic analysis of healthy and pathogenic tissue at single cell resolution”
4:00 pm – 4:20 pm: Melissa Passarelli, Concordia University, “Single-cell Imaging of Cells and Tissues”
4:20 pm – 4:40 pm: Francisco Fernández-Lima, Florida International University, “Following molecular changes during wound skin healing with topical statin treatment”
4:40 pm – 5:00 pm: Dmitryi Verkhoturov, Texas A&M University, “Detection of Biomarkers in single Extracellular Vesicles by Nano-Projectiles SIMS”
SIMS workshop: Poster session (Event Hall)
5:00 pm – 6:30 pm: Poster presentation followed by a cocktail reception with Award ceremony
Thursday, September 14, 2023
7:30 am – 4:30 pm U.S Central Time: Registration
8:15 am – 8:30 pm: Opening
SESSION: Analysis of complex samples, New strategies for challenging samples (BRC Auditorium)
8:30 am – 9:10 am: [INVITED SPEAKER] Anton Ievlev, Oak Ridge National Lab, “Correlated functional and chemical studies in energy materials using combined AFM/ToF-SIMS platform”
9:10 am – 9:30 am: David Carr, 3M Corporate Research Analytical Lab, “Practical In-situ TOF-SIMS Cross Sectioning”
9:30 am – 9:50 am: David Schafer, Justus Liebig University Giessen, “ToF-SIMS studies on the SEI Formation at Hard Carbon Anodes in Sodium Ion Batteries”
9:50 am – 10:10 am: Pawel Michalowski, Łukasiewicz Research Network – Institute of Microelectronics and Photonics, “SIMS characterization of MAX and MXene samples” – virtual
30 min- coffee break.
10:40 am – 11:00 am: Alan Spool, Western Digital, “How Sample Topography Affects TOF-SIMS Results” – virtual
11:00 am – 11:20 am: Michael Eller, California State University at Northridge, “Evaluating the role of photoacid generator loadings on EUV film homogeneity and byproduct production”
11:20 am – 11:40 am: Xiao-Ying Yu, Oak Ridge National Lab, “Detecting tritium, tritiated hydrocarbon, and lithium isotopes in the irradiated tritium production barrier used in light water reactors”
11:40 am – 12:00 pm: Group Picture – BRC outside patio
Lunch Break (Event Hall)
12:00 am – 1:30 pm: Luncheon Talk from the Sponsors
SESSION: Geology, Geo- & Cosmochemistry, Isotopes (BRC Auditorium)
1:30 pm – 2:10 pm: [INVITED SPEAKER] Christine Jilly-Rehak, Stanford University, “Using the NanoSIMS for high-precision stable isotope analysis of terrestrial and extra-terrestrial materials”
2:10 am – 2:30 pm: Sohini Sen-Britain, Lawrence Livermore National Laboratory, “Study of cluster ions produced from ToF-SIMS analysis of depleted uranium, C+ implanted uranium, and U-6Nb alloy targets”
2:30 am – 2:50 pm: Maitrayee Bose, Arizona State University, “Sulfur in Ryugu particles” – virtual
2:50 am – 3:10 pm: Thomas Barrett, Lunar and Planetary Institute / Universities Space Research Association, ”Deciphering the origin(s) of H and Cl in Apollo 15 quartz monzodiorites: evidence for multiple processes and reservoirs”
30 min- coffee break.
3:40 pm – 4:00 pm: Bret Davis, Montana State University, “ToF-SIMS at the Imaging and Chemical Analysis Laboratory, Montana State University: Applications to Organic Molecules and Biomarkers in the Earth and Space Sciences”
4:00 pm – 4:20 pm: Anna Johnson, Rice University, “Storage Capacity of Sulfur in Silicate Mantle Minerals Using Coordinated NanoSIMS and EPMA Analysis”
4:20 pm – 5:20 pm: Round-table about the North America SIMS society
Friday, September 15, 2023
8:30 am- 12:00 pm U.S Central Time: Tutorial seminar series
Tutorial seminar: IONTOF ToF-SIMS software seminar (Space Science & Technology building 300)
This event will include a 15 min- coffee break.
This event is only reserved to the registered participants who have selected to participate in the add-on option and the number of attendees will be limited.
Links for more detailed information:
