·························································································································
2021
Please join us for the next seminar on ToF-SIMS (Friday March 12th at 3:00PM – registration link).
It is the opportunity to learn more about ToF-SIMS and how it can be used to analyze a wide range of materials, including organic, inorganic and hybrid materials, biological samples, bulk materials and interfaces, and nanoscale materials. The ToF-SIMS seminar will introduce the basic aspects of ToF-SIMS such as surface spectrometry, ion imaging, depth profiling, 3D volume rendering and correlative analysis using in-situ AFM/ToF-SIMS (exclusive option). NEW illustrative examples of applications to different materials and problems will be discussed in details
·························································································································
