Users will have access only to the backmount and topmount sample holders. The use of other accessories such as the heating/cooling sample holder, the rotation sample holder, the transfer vessel and cantilever holder sample holders will be allowed only under the supervision by the Rice ToF-SIMS facility staff.
The scanning probe microscope (SPM) will be available to users through with the support of the ToF-SIMS staff. If required, the analysis can be performed before and/or after SIMS analysis on the region(s) of interest. Please consult Rice SIMS Facility staff to discuss SPM measurements.
Rice SIMS Facility provides a cleaving kit and sample preparation area. The users must keep the sample preparation area clean and immediately report any issues or problems such as damaged tools.
A logfile notebook is available on the instrument desk, and it required that users make use of the logbook to report analysis conditions and any problems that arise during the use of the instrument.
Staff-assisted reservations on the ToF-SIMS instrument should be booked a minimum of 3 working days before the date.
Any request for analysis to be done by the Rice SIMS Facility staff should be submitted a minimum of 1 week before the date needed.
Try to be sure that no other events will impede you in the use of the instrument at the date. Repeated last-minute cancellations are problematic, and may lead to loss of access privileges.
Collaborations are available on a limited basis, and only at the discretion of Rice SIMS Facility staff.
Users are encouraged to treat their own data. To improve Users’ understanding of data analysis of the ToF-SIMS acquisitions, different software seminars will be proposed every 3-6 months.
Data treatment performed by Rice SIMS Facility staff typically takes a minimum of 2 weeks following data acquisition; please plan your experiments and publication submissions accordingly.
Manuscripts resulting from collaborative work must be approved by Rice SIMS Facility staff prior to final submission, to ensure the quality of the SIMS data.