Join us to see our communications at the 22nd International Conference on Secondary Ion Mass Spectrometry (SIMS XXII), Kyoto, Japan, 20-25/10/2019 :
- Wednesday Evening, October 23rd, 2019 – 6:10 pm – 8:00 pm, SIMS poster session
Characterization of asphaltene deposits & solid bitumen by ToF-SIMS
- Thursday Morning, October 24th, 2019 – 11:10 -11:30 am, Analysis of Complex Samples, Depth Profiling and Imaging 3
Visualization of surface-active bottlebrush polymer additives through ToF-SIMS
- Thursday Morning, October 24th, 2019 – 11:30 -11:50 am, Bio-materials, Life Science and Biotechnology, Tissue imaging 5
ToF-SIMS Studies on Structural Colors in Korean Jeweled Beetle, Chrysochroa Coreana
