Shared Equipment Authority

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Tanguy Terlier

Research Specialist, ToF-SIMS instrument Manager
Website  | ResearchGate | Google Scholar | tanguy.terlier@rice.edu

He is experimented ToF-SIMS expert with analysis of a broad range of materials. His research interests include the understanding of the ion-matter interactions, the development of analysis protocols for the ToF-SIMS characterization and the use of various analytical tools such as Multivariate analysis, advanced computing algorithms (decision trees, machine learning…), and statistical simulation, in particular, Monte-Carlo simulation for the ion sputtering. He has also a strong experience in Scanning Probe Microscopy, particularly, for data fusion in correlative microscopy.

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